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Test Structures and Economical Non-Destructive Measurement Techniques for Multilayer Printed Circuit Board Impedance Characterization
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Copyright Title

Test Structures and Economical Non-Destructive Measurement Techniques for Multilayer Printed Circuit Board Impedance Characterization

Status

Published

on 6 Jan 2021
Year of Creation
2020
Copyright Claimant
Chun-Ting Wang Lee
Registration Number
TX0008936190
on 6 Jan 2021

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008936190) dated 6 Jan 2021, pertains to an electronic file (eService) titled "Test Structures and Economical Non-Destructive Measurement Techniques for Multilayer Printed Circuit Board Impedance Characterization" created in 2020. The copyright holder is Chun-Ting Wang Lee, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Chun-Ting Wang Lee.

Copyright Details


Copyright Claimant
Chun-Ting Wang Lee

Application Details


Registration Number
TX0008936190
Registration Date
1/6/2021
Year of Creation
2020
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Electronic file (eService)
First Publication Nation
United States

Personal Authors


Notes


Rights Note: Mark Dill, ProQuest, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600, disspub@proquest.com

Statements


Application Title Statement: Test Structures and Economical Non-Destructive Measurement Techniques for Multilayer Printed Circuit Board Impedance Characterization
Author Statement: Chun-Ting Tim Wang Lee Citizenship: not known Authorship: text
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