HomeOwner SearchCategory Search
Visit USCOProceedings of the Symposium on nondestructive wafer characterization for compound semiconductor materials and the Twenty-second state-of-the-art program on compound semiconductors (SOTAPOCS XXII) edited by V. Malhotra, V. Swaminathan, S. N. G. Chu ... [et al.] ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]
Text Registration
Copyright Title
Proceedings of the Symposium on nondestructive wafer characterization for compound semiconductor materials and the Twenty-second state-of-the-art program on compound semiconductors (SOTAPOCS XXII) edited by V. Malhotra, V. Swaminathan, S. N. G. Chu ... [et al.] ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]
Status
Published
on 14 Jun 2007
Year of Creation
1995
Copyright Claimant
Electrochemical Society, Inc. (employer for hire)
Registration Number
TX0004412953
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0004412953) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Proceedings of the Symposium on nondestructive wafer characterization for compound semiconductor materials and the Twenty-second state-of-the-art program on compound semiconductors (SOTAPOCS XXII) edited by V. Malhotra, V. Swaminathan, S. N. G. Chu ... [et al.] ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]" created in 1995. The copyright holder is Electrochemical Society, Inc. (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Electrochemical Society, Inc. (employer for hire).
Application Details
Registration Number
TX0004412953
Registration Date
6/14/2007
Year of Creation
1995
Place of First Publication
Pennington, NJ
Publisher Name
Electrochemical Society
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Electrochemical Society, Inc. Electronics Division Electrochemical Society, Inc. Dielectric Science and Technology Division Electrochemical Society, Inc
Physical Description
378 p
Series Statement
Proceedings vol. 95-6
Corporate Authors
Notes
Local Copyright Note: C.O. correspondence
Bibliographic Note: Add ti.: Nondestructive wafer characterization for compound semiconductor materials/SOTAPOCS XXII
© 2024 reserved by Trademarkia
Show terms & conditions
Disclaimer: The information contained in this website is provided for informational purposes only, and should not be construed as legal advice. Although LegalForce RAPC Worldwide P.C., dba Trademarkia P.C., is a law firm (the “Firm”), your use of this website does not establish an attorney-client relationship with the Firm. Such a relationship can only be established after the Firm decides that it is willing and able to accept the engagement after a conflict check and after a written retainer agreement is agreed upon between you and the Firm. Your use of this website is also subject to our Terms of Use and Privacy Policy. ** The entry level subscription is a bundled price which requires a minimum of two billing cycles, or 6 months.