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Proceedings of the Symposium on nondestructive wafer characterization for compound semiconductor materials and the Twenty-second state-of-the-art program on compound semiconductors (SOTAPOCS XXII) edited by V. Malhotra, V. Swaminathan, S. N. G. Chu ... [et al.] ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]
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Proceedings of the Symposium on nondestructive wafer characterization for compound semiconductor materials and the Twenty-second state-of-the-art program on compound semiconductors (SOTAPOCS XXII) edited by V. Malhotra, V. Swaminathan, S. N. G. Chu ... [et al.] ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]

Status

Published

on 14 Jun 2007
Year of Creation
1995
Registration Number
TX0004412953
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0004412953) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Proceedings of the Symposium on nondestructive wafer characterization for compound semiconductor materials and the Twenty-second state-of-the-art program on compound semiconductors (SOTAPOCS XXII) edited by V. Malhotra, V. Swaminathan, S. N. G. Chu ... [et al.] ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]" created in 1995. The copyright holder is Electrochemical Society, Inc. (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Electrochemical Society, Inc. (employer for hire).

Copyright Details


Application Details


Registration Number
TX0004412953
Registration Date
6/14/2007
Year of Creation
1995
Place of First Publication
Pennington, NJ
Publisher Name
Electrochemical Society
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Electrochemical Society, Inc. Electronics Division Electrochemical Society, Inc. Dielectric Science and Technology Division Electrochemical Society, Inc
Physical Description
378 p
Series Statement
Proceedings vol. 95-6

Notes


Local Copyright Note: C.O. correspondence
Bibliographic Note: Add ti.: Nondestructive wafer characterization for compound semiconductor materials/SOTAPOCS XXII
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