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Copper interconnects, new contact metallurgies/structures, and low-k interlevel dielectrics II Proceedings of the international symposium editor, G. S. Mathad, assistant editors, V. Bakshi, H. S. Rathore ... [et al.]
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Copper interconnects, new contact metallurgies/structures, and low-k interlevel dielectrics II Proceedings of the international symposium editor, G. S. Mathad, assistant editors, V. Bakshi, H. S. Rathore ... [et al.]

Status

Published

on 15 Jun 2007
Year of Creation
2003
Registration Number
TX0005976150
on 15 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0005976150) dated 15 Jun 2007, pertains to an electronic file (eService) titled "Copper interconnects, new contact metallurgies/structures, and low-k interlevel dielectrics II Proceedings of the international symposium editor, G. S. Mathad, assistant editors, V. Bakshi, H. S. Rathore ... [et al.]" created in 2003. The copyright holder is Electrochemical Society, Inc. (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Electrochemical Society, Inc. (employer for hire).

Copyright Details


Application Details


Registration Number
TX0005976150
Registration Date
6/15/2007
Year of Creation
2003
Place of First Publication
Pennington, NJ
Publisher Name
Electrochemical Society
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Electrochemical Society, Inc
Physical Description
276 p
Series Statement
Proceedings vol. 2003-10

Statements


Application Title Statement: Copper interconnects, low k interlevel dielectrics and new contact metallurgies/structures
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