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Microcircuit device reliability Reliability Analysis Center
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Serial Registration
Copyright Title

Microcircuit device reliability Reliability Analysis Center

Status

Published

on 11 Jun 2007
Year of Creation
1978
Copyright Claimant
I I T Research Institute
Registration Number
CSN0004985
on 11 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: CSN0004985) dated 11 Jun 2007, pertains to an electronic file (eService) titled "Microcircuit device reliability Reliability Analysis Center" created in 1978. The copyright holder is I I T Research Institute, known for their creative contributions in serial registration. For any inquiries concerning this copyrighted material, kindly reach out to I I T Research Institute.

Copyright Details


Copyright Claimant
I I T Research Institute

Application Details


Registration Number
CSN0004985
Registration Date
6/11/2007
Year of Creation
1978
Place of First Publication
Griffiss Air Force Base, N. Y
Publisher Name
RAC
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
United States. Department of Defense. Information Analysis Center. Reliability Analysis Center IIT Research Institute
Physical Description
print material

Notes


Copyright Local Holdings: no. 8, 1978 Claimant: I I T Research Institute Issue title: Digital failure rate data / prepared by Mark R. Klein, David B. Nicholls. Prev. pub. as Digitial generic data, 1975 Created 1978 Pub. 1978-05-31 Reg. 1978-06-14 TX0000054943 19780531summer 78 Claimant: I I T Research Institute Issue title: Hybrid circuit data / prepared by Timothy E. Turner Created 1978 Pub. 1978-07-26 Reg. 1978-10-12 TX0000222972 19780726
Material Matter Claimed Note: New matter: additions

Statements


Author Statement: I I T Research Institute, employer for hire
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