Computer File Registration
Copyright Title
PDF-4+ 2016
Status
Published
on 4 Nov 2016
Year of Creation
2016
Copyright Claimant
JCPDS - International Centre for Diffraction Data
Registration Number
TX0008356468
on 4 Nov 2016Copyright Summary
The U.S. Copyright record (Registration Number: TX0008356468) dated 4 Nov 2016, pertains to an electronic file (eService) titled "PDF-4+ 2016" created in 2016. The copyright holder is JCPDS - International Centre for Diffraction Data, known for their creative contributions in computer file registration. For any inquiries concerning this copyrighted material, kindly reach out to JCPDS - International Centre for Diffraction Data.
Application Details
Registration Number
TX0008356468
Registration Date
11/4/2016
Year of Creation
2016
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
JCPDS - International Centre for Diffraction Data
Physical Description
DVD + Print material
First Publication Nation
United States
ISSN
1539-333x
Preexisting Material
computer program, Compilation of crystallographic, diffraction, and physical property data
Personal Authors
Notes
Rights Note: JCPDS - International Centre for Diffraction Data, 12 Campus Blvd., Newtown Square, PA, 19073, United States, (610) 325-9814
Local Copyright Note: Basis for Registration: Unit of publicationRegarding previous registration: Refers to correspondence, not registration
Material Matter Claimed Note: computer program, Compilation of crystallographic, diffraction, and physical property data
Previous Registration Note: 2015, 1-27372428552014, TX 8-033-120
Statements
Application Title Statement: PDF-4+ 2016
Author Statement: JCPDS - International Centre for Diffraction Data employer for hire Citizenship: United States Authorship: computer program, Compilation of crystallographic, diffraction, and physical property data X. Chen Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data E. Alekseeva Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Antipov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data N. Audebrand Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data A. Babaryk Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data V. Baumer Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data R. Ben Hassen Citizenship: Tunisia Authorship: Compilation of crystallographic, diffraction, and physical property data L. Fang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data R. Gladyshevskii Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data A. Gribanov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data W. He Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data S. Ivanov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data J. Kaduk Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data E. Khaikina Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data G. Kimmel Citizenship: Israel Authorship: Compilation of crystallographic, diffraction, and physical property data S. Kirik Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Knyazev Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data W. Lasocha Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data B. Lazoryak Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data S.-F. Lin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data J. M. Merino Citizenship: Spain Authorship: Compilation of crystallographic, diffraction, and physical property data M. Qin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data A. Morozkin Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data S. Pagola Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data H. Poellmann Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data A. Puzan Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data P. Rao Citizenship: India Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Seryotkin Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data T. Shkarina Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data L. Vasylechko Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data X. Yao Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data I. Zavaliy Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data H. Zhang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data J. Zheng Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data O. Zmii Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data
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