PDF-4/Axiom 2019

Computer File Registration

PDF-4/Axiom 2019

Status

Published

on 2 Oct 2018

Year of Creation

2018

JCPDS - International Centre for Diffraction Data

Registration Number

TX0008640421

on 2 Oct 2018

The U.S. Copyright record (Registration Number: TX0008640421) dated 2 Oct 2018, pertains to an electronic file (eService) titled "PDF-4/Axiom 2019" created in 2018. The copyright holder is JCPDS - International Centre for Diffraction Data, known for their creative contributions in computer file registration. For any inquiries concerning this copyrighted material, kindly reach out to JCPDS - International Centre for Diffraction Data.

JCPDS - International Centre for Diffraction Data

Application Details

Registration Number

TX0008640421

Registration Date

10/2/2018

Year of Creation

2018

Agency Marc Code

DLC-CO

Record Status

New

Corporate Author

JCPDS - International Centre for Diffraction Data

Physical Description

Printed material + 2 DVDs

First Publication Nation

United States

ISSN

2578-8175

Personal Authors

Corporate Authors

JCPDS - International Centre for Diffraction Data

Notes

Rights Note: JCPDS - International Centre for Diffraction Data, 12 Campus Blvd, Newtown Square, PA, 19073, (610) 325-9814

Statements

Application Title Statement: PDF-4/Axiom 2019

Author Statement: JCPDS - International Centre for Diffraction Data employer for hire Citizenship: United States Authorship: computer program, Compilation of crystallographic, diffraction, and physical property data Y. Che Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data X. Chen Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data S.-F. Lin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data X. Yao Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data J. Henao Citizenship: Colombia Authorship: Compilation of crystallographic, diffraction, and physical property data R. Pazout Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data N. Audebrand Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data H. Poellmann Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data S. Ganesanpotti Citizenship: India Authorship: Compilation of crystallographic, diffraction, and physical property data W. Lasocha Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data E. Alekseeva Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data I. Bushmarinov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data S. Kirik Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Knyazev Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data T. Shkarina Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data I. Zanin Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data R. Ben Hassen Citizenship: Tunisia Authorship: Compilation of crystallographic, diffraction, and physical property data V. Baumer Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data A. Puzan Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data S. Chong Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data J. Kaduk Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data L. Fang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data J. M. Delgado Citizenship: Venezuela Authorship: Compilation of crystallographic, diffraction, and physical property data W. He Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data D. Li Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data M. Qin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data H. Zhang Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data P. Rao Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data G. Kimmel Citizenship: Israel Authorship: Compilation of crystallographic, diffraction, and physical property data E. Antipov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data A. Gribanov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data S. Ivanov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Khaikina Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data A. Morozkin Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data A. Babaryk Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data R. Gladyshevskii Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data L. Vasylechko Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data I. Zavaliy Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data B. Acharya Citizenship: India Authorship: Compilation of crystallographic, diffraction, and physical property data K. Aleksandrov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data M. Avdeev Citizenship: Portugal Authorship: Compilation of crystallographic, diffraction, and physical property data I. Baker Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data E. Banks Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data J. Bernstein Citizenship: Israel Authorship: Compilation of crystallographic, diffraction, and physical property data P. Bayliss Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data P. Bezdicka Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data F. Blanchard Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data O. Bodak Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data B. Bondars Citizenship: Latvia Authorship: Compilation of crystallographic, diffraction, and physical property data W. Bronger Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data J. Cantrell Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data R. Chourasia Citizenship: India Authorship: Compilation of crystallographic, diffraction, and physical property data B. Davis Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data C. Dong Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data H. Ehrenberg Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data W. Engel Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data M. Epple Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data W. Eysel Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data A. Fedorchuk Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data J. Felsche Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data S. Filatov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data L. Fink Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data M. Francesconi Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data Z. Fu Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data H. Fuess Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data S. Granovsky Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data M. Greenblatt Domicile: United States Authorship: Compilation of crystallographic, diffraction, and physical property data S. Gromilov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data L. Gulay Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data J. Holsa Citizenship: Finland Authorship: Compilation of crystallographic, diffraction, and physical property data Irvine, J Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data J. James Citizenship: India Authorship: Compilation of crystallographic, diffraction, and physical property data W. Jeitschko Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Jia Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data Z. Jin Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data O. Karimova Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Kemnitz Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data C. Kennard Citizenship: Australia Authorship: Compilation of crystallographic, diffraction, and physical property data K. Knizek Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data A. Korotkov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data V. Kroutko Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data M. Krunks Citizenship: Estonia Authorship: Compilation of crystallographic, diffraction, and physical property data A. Kurdyumov Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data G. Kuzmicheva Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data B. Lazoryak Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data R. Li Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data P. Lightfoot Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data V. Lisoivan Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data G.-l. Lu Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Lu Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data J. Macicek Citizenship: Bulgaria Authorship: Compilation of crystallographic, diffraction, and physical property data J. Maixner Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data H. Mandar Citizenship: Estonia Authorship: Compilation of crystallographic, diffraction, and physical property data A. Mar Citizenship: Canada Authorship: Compilation of crystallographic, diffraction, and physical property data W. Mayo Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data D. Mazza Citizenship: Italy Authorship: Compilation of crystallographic, diffraction, and physical property data G. McCarthy Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data A. McDonald Citizenship: Canada Authorship: Compilation of crystallographic, diffraction, and physical property data J. M. Merino Citizenship: Spain Authorship: Compilation of crystallographic, diffraction, and physical property data G. Meyer Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data J.-X. Mi Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data D. Mullica Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data V. Nalbandyan Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Olszewska Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data S. Pagola Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data L. Palacio Citizenship: Colombia Authorship: Compilation of crystallographic, diffraction, and physical property data O. Parasyuk Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data W. Paszkowicz Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data V. Pecharsky Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Peng Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data S. Pikus Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data L. Plyasova Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data S. Polyakov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data J. Post Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data A. Prosenko Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data M. Quarton Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data S. Quick Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data A. Rafalska-Lasocha Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data K.-J. Range Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data N. Reeves-McLaren Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data D. Rendle Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data I. Rozhdestvenskaya Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data Z. Rzaczynska Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data I. Sanc Citizenship: Czech Republic Authorship: Compilation of crystallographic, diffraction, and physical property data B. Scheetz Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data M. Schneider Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data W. Schreiner Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data N. Serebryanaya Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Seryotkin Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data V. Shuvaeva Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data J. Skakle Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data E. Sokolova Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data E. Sonneveld Citizenship: Netherlands Authorship: Compilation of crystallographic, diffraction, and physical property data B. Stelmakhovych Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data L. Suescun Citizenship: Uruguay Authorship: Compilation of crystallographic, diffraction, and physical property data B. Tataryn Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data E. Tillmanns Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data M. Touboul Citizenship: France Authorship: Compilation of crystallographic, diffraction, and physical property data R. Ubic Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data A. Vasiliev Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data V. Vlasenko Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data O. Vyunov Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data P. Wang Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data M. Wendschuh Citizenship: not known Authorship: Compilation of crystallographic, diffraction, and physical property data A. West Citizenship: United Kingdom Authorship: Compilation of crystallographic, diffraction, and physical property data M. Whittingham Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data G. Will Citizenship: Germany Authorship: Compilation of crystallographic, diffraction, and physical property data M. Wolcyrz Citizenship: Poland Authorship: Compilation of crystallographic, diffraction, and physical property data W. Wong-Ng Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data B. Wu Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data Y. Xi Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data L. Ximen Citizenship: China Authorship: Compilation of crystallographic, diffraction, and physical property data M. Yashima Citizenship: Japan Authorship: Compilation of crystallographic, diffraction, and physical property data A. Yatsenko Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data P. Zavalij Citizenship: United States Authorship: Compilation of crystallographic, diffraction, and physical property data O. Zhbankov Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data J. Zheng Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data J. Zheng Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data O. Zmii Citizenship: Ukraine Authorship: Compilation of crystallographic, diffraction, and physical property data V. Zubkov Citizenship: Russia Authorship: Compilation of crystallographic, diffraction, and physical property data

Notes

Rights Note: JCPDS - International Centre for Diffraction Data, 12 Campus Blvd, Newtown Square, PA, 19073, (610) 325-9814

Statements

Application Title Statement: PDF-4/Axiom 2019

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