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Visit USCOCharacterization methods for submicron MOSFETs edited by Hisham Haddara
Text Registration
Copyright Title
Characterization methods for submicron MOSFETs edited by Hisham Haddara
Status
Published
on 14 Jun 2007
Year of Creation
1995
Copyright Claimant
Kluwer Academic Publishers
Registration Number
TX0004254776
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0004254776) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Characterization methods for submicron MOSFETs edited by Hisham Haddara" created in 1995. The copyright holder is Kluwer Academic Publishers, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Kluwer Academic Publishers.
Application Details
Registration Number
TX0004254776
Registration Date
6/14/2007
Year of Creation
1995
Place of First Publication
Boston
Publisher Name
Kluwer Academic Publishers
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
232 p
Series Statement
The Kluwer international series in engineering and computer science
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