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Visit USCODelay fault testing for VLSI circuits Angela Krstic, Kwang-ting (Tim) Chen
Text Registration
Copyright Title
Delay fault testing for VLSI circuits Angela Krstic, Kwang-ting (Tim) Chen
Status
Published
on 14 Jun 2007
Year of Creation
1998
Copyright Claimant
Kluwer Academic Publishers
Registration Number
TX0004879024
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0004879024) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Delay fault testing for VLSI circuits Angela Krstic, Kwang-ting (Tim) Chen" created in 1998. The copyright holder is Kluwer Academic Publishers, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Kluwer Academic Publishers.
Application Details
Registration Number
TX0004879024
Registration Date
6/14/2007
Year of Creation
1998
Place of First Publication
Boston
Publisher Name
Kluwer Academic
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
191 p
Series Statement
Frontiers in electronic testing
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