HomeOwner SearchCategory Search
Delay fault testing for VLSI circuits Angela Krstic, Kwang-ting (Tim) Chen
Visit USCO
hero image
Text Registration
Copyright Title

Delay fault testing for VLSI circuits Angela Krstic, Kwang-ting (Tim) Chen

Status

Published

on 14 Jun 2007
Year of Creation
1998
Copyright Claimant
Kluwer Academic Publishers
Registration Number
TX0004879024
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0004879024) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Delay fault testing for VLSI circuits Angela Krstic, Kwang-ting (Tim) Chen" created in 1998. The copyright holder is Kluwer Academic Publishers, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Kluwer Academic Publishers.

Copyright Details


Copyright Claimant
Kluwer Academic Publishers

Application Details


Registration Number
TX0004879024
Registration Date
6/14/2007
Year of Creation
1998
Place of First Publication
Boston
Publisher Name
Kluwer Academic
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
191 p
Series Statement
Frontiers in electronic testing
Get your copyright registered todayThousands have copyrighted their assets.
What are you waiting for?

© 2024 reserved by Trademarkia
Show terms & conditions