Effect of Microscopic Defects on Superconducting Properties of High Purity Niobium Used for Srf Cavities

Text Registration

Effect of Microscopic Defects on Superconducting Properties of High Purity Niobium Used for Srf Cavities

Status

Published

on 9 Apr 2020

Year of Creation

2020

Mingmin Wang

Registration Number

TX0008865168

on 9 Apr 2020

The U.S. Copyright record (Registration Number: TX0008865168) dated 9 Apr 2020, pertains to an electronic file (eService) titled "Effect of Microscopic Defects on Superconducting Properties of High Purity Niobium Used for Srf Cavities" created in 2020. The copyright holder is Mingmin Wang, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Mingmin Wang.

Mingmin Wang

Application Details

Registration Number

TX0008865168

Registration Date

4/9/2020

Year of Creation

2020

Agency Marc Code

DLC-CO

Record Status

New

Physical Description

Electronic file (eService)

First Publication Nation

United States

Personal Authors

Mingmin Wang

Notes

Rights Note: Mark Dill, ProQuest, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600, disspub@proquest.com

Statements

Application Title Statement: Effect of Microscopic Defects on Superconducting Properties of High Purity Niobium Used for Srf Cavities

Author Statement: Mingmin Wang Citizenship: not known Authorship: text

Notes

Rights Note: Mark Dill, ProQuest, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600, disspub@proquest.com

Statements

Application Title Statement: Effect of Microscopic Defects on Superconducting Properties of High Purity Niobium Used for Srf Cavities

Author Statement: Mingmin Wang Citizenship: not known Authorship: text

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