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Process and materials characterization and diagnostics in IC manufacturing 27-28 Feb. 2003, Santa Clara, California, USA Kenneth W. Tobin, Jr., Iraj Emami, editors
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Copyright Title

Process and materials characterization and diagnostics in IC manufacturing 27-28 Feb. 2003, Santa Clara, California, USA Kenneth W. Tobin, Jr., Iraj Emami, editors

Status

Published

on 15 Jun 2007
Year of Creation
2003
Registration Number
TX0005789734
on 15 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0005789734) dated 15 Jun 2007, pertains to an electronic file (eService) titled "Process and materials characterization and diagnostics in IC manufacturing 27-28 Feb. 2003, Santa Clara, California, USA Kenneth W. Tobin, Jr., Iraj Emami, editors" created in 2003. The copyright holder is Society of Photo-Optical Instrumentation Engineers (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Society of Photo-Optical Instrumentation Engineers (employer for hire).

Application Details


Registration Number
TX0005789734
Registration Date
6/15/2007
Year of Creation
2003
Place of First Publication
Bellingham, WA
Publisher Name
SPIE
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Society of Photo-Optical Instrumentation Engineers
Physical Description
222 p
Series Statement
SPIE proceedings series vol. 5041
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