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Electron Beam Induced Current in Wide Bandgap Semiconductors Using Scanning Transmission Electron Microscopy
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Copyright Title

Electron Beam Induced Current in Wide Bandgap Semiconductors Using Scanning Transmission Electron Microscopy

Status

Published

on 5 Mar 2021
Year of Creation
2020
Copyright Claimant
Zoey Warecki
Registration Number
TX0008950164
on 5 Mar 2021

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008950164) dated 5 Mar 2021, pertains to an electronic file (eService) titled "Electron Beam Induced Current in Wide Bandgap Semiconductors Using Scanning Transmission Electron Microscopy" created in 2020. The copyright holder is Zoey Warecki, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Zoey Warecki.

Copyright Details


Copyright Claimant
Zoey Warecki

Application Details


Registration Number
TX0008950164
Registration Date
3/5/2021
Year of Creation
2020
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Electronic file (eService)
First Publication Nation
United States

Personal Authors


Notes


Rights Note: Mark Dill, ProQuest, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600, disspub@proquest.com

Statements


Application Title Statement: Electron Beam Induced Current in Wide Bandgap Semiconductors Using Scanning Transmission Electron Microscopy
Author Statement: Zoey Warecki Citizenship: not known Authorship: text
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